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IN-SITU CORRELATIVE ANALYSIS OF MECHANICAL, ELECTRICAL, AND MAGNETIC PROPERTIES BY COMBINATION OF AFM AND SEM- including LIVE-DEMO
September 23rd, 2021
11:00 - 12:30
Faculty of Civil and Industrial Engineering - Sapienza University of Rome
Combining different analytical methods into one instrument is of great importance for the simultaneous acquisition of complementary information. Especially highly localized probing of mechanical, electrical, magnetic, chemical, and crystallographic properties on the nanoscale represents a key success factor for gaining new insights into the micro and nano-world.
We combine two of the most powerful microscopy methods, scanning electron microscopy (SEM) and atomic force microscopy (AFM). Especially the capability to integrate the AFM system directly inside the high-vacuum environment of the SEM enables a completely new way to perform your research and your experiments.
We will present a variety of case studies to highlight the advantages of interactive correlative in-situ nanoscale characterization for different materials and nanostructures.
In the second part of the presentation, we will conduct a Live-Demo of the AFSEM system. We will show you how easily a measurement is carried out and correlative data is obtained. We will demonstrate both a topography measurement on a free-standing graphene membrane and MFM measurement on a multilayer Pt/Co-sample. Furthermore, we will focus on the mount and demount of the system, the localization of the region of interest, and the typical workflow when working with the AFSEM.
Christian SCHWALB, Chief Operating Officer at Quantum Design Microscopy
Marion WOLFF, Assistant Industrial Engineer at Quantum Design Microscopy
Hajo FRERICHS, Application Specialist at Quantum Design Microscopy
The Event will be held REMOTELY