||go to QR-CODE|
Advanced Characterization Techniques
September 22nd, 2021
09:00 - 12:30 & 14:00 - 15:30
Faculty of Civil and Industrial Engineering - Sapienza University of Rome
Speaker to be confirmed
TESCAN ORSAY HOLDING/ASSING
Dynamic micro-CT - Pushing the temporal and spatial boundaries for true in situ experimentation
Lars Oliver KAUTSCHOR
TESCAN ORSAY HOLDING
X-ray micro-computed tomography (micro-CT) has opened new avenues of research and understanding. It is now recognized as an essential technique for non-destructive 3D imaging. Extending the technique to the temporal regime, through time-resolved 3D imaging (or 4D imaging), provides a new route to better and more complete understanding of materials evolution, facilitating in situ investigations ranging from mechanical deformation to fluid flow in porous materials. Imaging of dynamic processes has historically been one of the key applications at synchrotron micro-CT beamlines, extending the limits of temporal resolution further and further. However, access to those facilities is often limited and highly selective.
In lab based micro-CT, image quality and spatial resolution have been significantly improved over the last two decades, often at the cost of temporal resolution. In addition to sub-micron spatial resolution, TESCAN Dynamic micro-CT solutions make it possible to visualize and inspect multi-dimensional dynamic processes in the laboratory with a temporal resolution below 3 seconds.
In this talk we explore the general technique of micro-CT as well as the different aspects and challenges of temporally resolved dynamic X-ray 3D imaging. The use of dynamic CT across the fields of materials science, life science, and geoscience will be highlighted through a number of application examples.
Innovative FIB/SEM Lift-out Solutions for Advanced TEM Lamella Preparation Requirements
TESCAN ORSAY HOLDING
From data to information with selective BSE contrast methods of TESCAN’s CLARA Field-Free UHR-SEM
Discussion and conclusion
Multi-modal correlative microscopy using AFM in SEM
Scanning electron microscopy (SEM) and atomic force microscopy (AFM) are two of the most used, complementary techniques for surface analysis at the nanoscale. Combining them by integrating a compact AFM into SEM brings novel possibilities for true correlative microscopy and advanced multi-modal sample characterization that would be often unfeasible using each imaging modality separately. LiteScope 2.0 produced by NenoVision company is a unique AFM designed for „plug & play“ integration into the SEMs allowing the use of Correlative Probe and Electron Microscopy (CPEM) technique which represents a hardware correlative technology, enabling simultaneous data acquisition of AFM (3D topography, electrical, mechanical, and magnetic measurements) and SEM signals (chemical analysis, FIB/GIS surface modification, etc.). This combination opens door for very complex surface investigation in a variety of fields such as Material science, Nanotechnology, Semiconductors, Life science and other areas of research and industry.
Infrared (IR) Chemical Identification at the Nanoscale – When AFM meets IR
Bruker Surface Analysis
This presentation will overview atomic force microscope based infrared spectroscopy (Photothermal AFM-IR). The technique is based on the combination of a tunable infrared laser with an atomic force microscope that can locally map and measure thermal expansion of nanoscale regions of a sample resulting from the absorption of infrared radiation. The photothermal AFM-IR technique uses the tip of an AFM as a nanoscale detector of absorption of IR radiation. Therefore, AFM-IR can be used to obtain IR absorption spectra and chemical imaging with resolution as fine as the AFM tip radius, >100X smaller than spatial resolution limits of conventional infrared spectroscopy. One of the key benefits is that AFM-IR directly correlates to FT-IR transmission spectroscopy which makes it possible to use existing IR libraries for chemical identification at the nanoscale.
In the presentation we will introduce the underlying technology and highlight numerous applications ranging from polymer characterization, life and material sciences.
High-Speed Atomic Force Microscopy and Super-Resolution Optics - Multiparametric Correlative Microscopy Solutions from Bruker Nano Surfaces
Bruker Surface Analysis
AFM currently offers premium spatial resolution of the analysed samples while simultaneously being able to correlate topography and mechanics at near native/physiological imaging conditions. Recent technology developments from Bruker Nano Surfaces have led to unprecedented imaging rates in fluid, setting new milestones for high-speed scanning at 50 frames/sec in life science scenarios. We will introduce the concept and applications of high-speed imaging for real-time visualization of protein binding kinetics, as well as molecular and cellular dynamics. We will further discuss and show examples of how the combination of fast imaging with advanced super-resolution optics leverages the advantages of immunolabelling techniques for truly correlative microscopy. Through an innovative sample stage design, we will show how a wide choice of scanners, together with optical tiling and multi-region AFM probing, enables multiparametric mechanical characterization of soft samples over a large area and provides additional optical data sets.