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     The Co-organizers list is provisional and updated on June 24th, 2021. Others Co-organizers will be added, accordingly to the progress of event organization.

Tescan, Nenovision and Bruker

 
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Assing 2017

Advanced Characterization Techinques

September 22nd, 2021
09:00 - 12:30 & 14:00 - 15:30

Faculty of Civil and Industrial Engineering - Sapienza University of Rome 


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Introduction
 

Speaker to be confirmed
TESCAN ORSAY HOLDING/ASSING

Pushing the temporal and spatial boundaries for true in situ experimentation 
Lars Oliver KAUTSCHOR
TESCAN ORSAY HOLDING

Innovative FIB/SEM Lift-out Solutions for Advanced TEM Lamella Preparation Requirements
Martin SUCHANEK
TESCAN ORSAY HOLDING

From data to information with selective BSE contrast methods of TESCAN’s CLARA Field-Free UHR-SEM
Giuliano CASATI
ASSING

Discussion and conclusion



NenoVision

Multi-modal correlative microscopy using AFM in SEM

Jan NEUMAN
Nenovision


ABSTRACT

Scanning electron microscopy (SEM) and atomic force microscopy (AFM) are two of the most used, complementary techniques for surface analysis at the nanoscale. Combining them by integrating a compact AFM into SEM brings novel possibilities for true correlative microscopy and advanced multi-modal sample characterization that would be often unfeasible using each imaging modality separately. LiteScope 2.0 produced by NenoVision company is a unique AFM designed for „plug & play“ integration into the SEMs allowing the use of Correlative Probe and Electron Microscopy (CPEM) technique which represents a hardware correlative technology, enabling simultaneous data acquisition of AFM (3D topography, electrical, mechanical, and magnetic measurements) and SEM signals (chemical analysis, FIB/GIS surface modification, etc.). This combination opens door for very complex surface investigation in a variety of fields such as Material science, Nanotechnology, Semiconductors, Life science and other areas of research and industry.


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Infrared (IR) Chemical Identification at the Nanoscale – When AFM meets IR
Miriam UNGER
Bruker Surface Analysis

ABSTRACT

This presentation will overview atomic force microscope based infrared spectroscopy (Photothermal AFM-IR). The technique is based on the combination of a tunable infrared laser with an atomic force microscope that can locally map and measure thermal expansion of nanoscale regions of a sample resulting from the absorption of infrared radiation. The photothermal AFM-IR technique uses the tip of an AFM as a nanoscale detector of absorption of IR radiation. Therefore, AFM-IR can be used to obtain IR absorption spectra and chemical imaging with resolution as fine as the AFM tip radius, >100X smaller than spatial resolution limits of conventional infrared spectroscopy.  One of the key benefits is that AFM-IR directly correlates to FT-IR transmission spectroscopy which makes it possible to use existing IR libraries for chemical identification at the nanoscale.

In the presentation we will introduce the underlying technology and highlight numerous applications ranging from polymer characterization, life and material sciences.

High-Speed Atomic Force Microscopy and Super-Resolution Optics - Multiparametric Correlative Microscopy Solutions from Bruker Nano Surfaces
Tanja NEUMANN
Bruker Surface Analysis

ABSTRACT

AFM currently offers premium spatial resolution of the analysed samples while simultaneously being able to correlate topography and mechanics at near native/physiological imaging conditions. Recent technology developments from Bruker Nano Surfaces have led to unprecedented imaging rates in fluid, setting new milestones for high-speed scanning at 50 frames/sec in life science scenarios. We will introduce the concept and applications of high-speed imaging for real-time visualization of protein binding kinetics, as well as molecular and cellular dynamics. We will further discuss and show examples of how the combination of fast imaging with advanced super-resolution optics leverages the advantages of immunolabelling techniques for truly correlative microscopy. Through an innovative sample stage design, we will show how a wide choice of scanners, together with optical tiling and multi-region AFM probing, enables multiparametric mechanical characterization of soft samples over a large area and provides additional optical data sets.


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ORGANIZERS

 

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Associazione NanoItaly 300

 

INSTITUTIONAL PARTNERS

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