Advanced solutions for characterizations in nanoscience
24 SEPTEMBER
11:00 - 12:30
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| ROOM 15 | ||||
| TT.X - Technical Multi-Track with Parallel SYMPOSIA | ||||
| Advanced solutions for characterizations in nanoscience | ||||
| Co-organized with Sapienza University of Rome Chair: Daniele PASSERI, Sapienza University of Rome |
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| Design and optimization of nanomaterials and nanosystems is increasingly demanding the development of innovative instrumentations for the advanced characterizations of their morphology, structure and physical-chemical properties as well as of software tools for data analysis in the FAIR (findability, accessibility, interoperability, and reuse) metadata point of view. This session has been specifically conceived to give an account of some recently developed tools for the size analysis of anisotropic nanoparticles, of structural investigation of nanocrystalline materials, and for the in situ data management in TEM imaging. | ||||
| The symposium is part of the Symposia | ||||
| TT.X.F.1 SY.XXVII.1 |
Mathias A. MOSIG |
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| TT.X.F.2 SY.XXVII.2 |
Danny STAM - CV Eldico Scientific AG The nanocrystallography revolution: A dedicated device for 3D-Electron Diffraction experiments on nanocrystals |
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| TT.X.F.3 SY.XXVII.3 |
Francesca SBRANA Schaefer Italy D-DLS a new solution for anisotropic nanoparticle characterization |
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Back to Plan 24 September  |
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