In Engineering, Nanomaterials and Materials Science, today the researcher needs to connect information from multiple and complementary characterization techniques to answer fundamental Scientific Questions and create Innovation. How do we connect multimodal data from your 2D and 3D devices, materials, biomaterials, Micro and Nano-particles, to get a holistic view on our samples?

Whether you aim for fundamental understanding in materials science or want to improve the composition of future materials for energy storage or metals lightweight construction, microscopy systems are designed to provide the data we need to progress in this field.

In this seminar we will investigate multi-scale and multi-modal Microscopy in different fields and we will focus on the next generation technology for FEG-SEMs, multi beam FIBSEM (Gallium, laser, etc.), X-Ray Microscopes and integrations of in-situ characterization techniques like AFM.

We will present case studies of Sub-micron X-ray Microscopy in The Artificial Bone Grafting, STEM applications, FIBSEM and Multi-beam in TEM Lamella preparation, Cross-sections, and Nanotomography.